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Being the fault detection improvement device and the fault detection improvement device which adjusts fault detection

机译:是故障检测改善装置和调整故障检测的故障检测改善装置

摘要

PROBLEM TO BE SOLVED: To provide a failure detection improving device, a failure detection improving program, and a failure detection improving method improving a failure detection rate by carrying out change of a circuit such that an ATPG tool can generate a test pattern.;SOLUTION: The failure detection improving device is for correcting a netlist, and it is provided with a netlist input part for inputting the netlist, a circuit correcting part adding an FF for observation in a suitable place in the netlist, and a netlist output part outputting the netlist changed by the circuit correcting part.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种故障检测改进装置,故障检测改进程序和故障检测改进方法,该方法通过进行电路改变以使ATPG工具可以生成测试图案来提高故障检测率。故障检测改善装置是用于校正网表的装置,其具有:网表输入部,用于输入网表;电路校正部,在网表的适当位置添加用于观察的FF;以及网表输出部,其输出网表输入部。电路校正部分更改了网表。;版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4541196B2

    专利类型

  • 公开/公告日2010-09-08

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20050072631

  • 发明设计人 鴫原 靖二;本間 靖知;巻島 博道;

    申请日2005-03-15

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 18:58:13

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