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Fluorescence measurement method, fluorescence measuring device and sample evaluation apparatus using the same

机译:荧光测定方法,荧光测定装置及使用该方法的样品评价装置

摘要

PROBLEM TO BE SOLVED: To provide a fluorometry, fluorometer, and sample evaluating apparatus for using the same, capable of accurately and efficiently computing waveform data, etc., regardless of the fluctuation in the time waveform of fluorescence.;SOLUTION: A sample S is irradiated with a pulsating pumping light supplied from a pumping source 1, and fluorescence while occurs at the sample S is detected by an optical detector 5 via an optical focusing system 3 and a spectroscope 4. Data analysis is performed simultaneously on the time waveform of the fluorescence at the data processing part 62 of a control device 6, to computer physical quantities such as waveform data and a florescence lifetime. At this point, the time waveform of the pumping light is fixed and arranged to a time base used for the data analysis, and a plurality of fitting commutations are performed as moving the time waveform of the excitation light and a fitting range from an initial location before the pumping light peak toward a completing location after the pumping light peak, to select optimal measurement waveform data according to prescribed selection criterion.;COPYRIGHT: (C)2001,JPO
机译:解决的问题:提供一种荧光计,荧光计和使用该荧光计的样品评估装置,无论荧光时间波形的波动如何,都能够准确而有效地计算波形数据等。用从泵浦源1提供的脉动泵浦光进行照射,并由光学检测器5经由光学聚焦系统3和分光镜4检测在样品S上发生的荧光。在控制装置6的数据处理部分62处的荧光,以计算诸如波形数据和荧光寿命的物理量。此时,将泵浦光的时间波形固定并布置到用于数据分析的时基,并且随着将激发光的时间波形和拟合范围从初始位置移开,执行多个拟合换向。在泵浦光峰到达完成位置之前,根据规定的选择标准选择最佳的测量波形数据。版权所有:(C)2001,日本特许厅

著录项

  • 公开/公告号JP4459390B2

    专利类型

  • 公开/公告日2010-04-28

    原文格式PDF

  • 申请/专利权人 浜松ホトニクス株式会社;

    申请/专利号JP20000172454

  • 发明设计人 渡邉 元之;井口 和也;

    申请日2000-06-08

  • 分类号G01N21/64;

  • 国家 JP

  • 入库时间 2022-08-21 18:57:07

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