首页> 外国专利> Layout of Cell of Semiconductor Device Having Linear Shaped Gate Electrode Layout Features Defined with Minimum End-to-End Spacing and Having Equal Number of PMOS and NMOS Transistors and Having Corresponding p-type and n-type Diffusion Regions Separated by Central Inactive Region

Layout of Cell of Semiconductor Device Having Linear Shaped Gate Electrode Layout Features Defined with Minimum End-to-End Spacing and Having Equal Number of PMOS and NMOS Transistors and Having Corresponding p-type and n-type Diffusion Regions Separated by Central Inactive Region

机译:具有线性形状的栅电极布局特征的半导体器件的单元布局,该特征具有最小的端到端间距和相等数量的PMOS和NMOS晶体管,并且具有相应的p型和n型扩散区,中间扩散区被中心无效区隔开

摘要

A cell layout of a semiconductor device includes a diffusion level layout including a plurality of diffusion region layout shapes, including p-type and n-type diffusion regions separated by a central inactive region. The cell layout also includes a gate electrode level layout for the entire cell defined to include linear-shaped layout features placed to extend in only a first parallel direction. Adjacent linear-shaped layout features that share a common line of extent in the first parallel direction are separated from each other by an end-to-end spacing that is substantially equal and minimized across the gate electrode level layout. Linear-shaped layout features within the gate electrode level layout extend over one or more of the p-type and/or n-type diffusion regions to form PMOS and NMOS transistor devices. A number of the PMOS transistor devices is equal to a number of the NMOS transistor devices in the cell.
机译:半导体器件的单元布局包括具有多个扩散区域布局形状的扩散级布局,该多个扩散区域布局形状包括被中心非活性区域分开的p型和n型扩散区域。单元布局还包括用于整个单元的栅电极级布局,该栅电极级布局被定义为包括仅在第一平行方向上延伸的线形布局特征。在第一平行方向上具有共同的延伸范围线的相邻的线性布局特征彼此之间以基本相等的端到端间隔彼此隔开,并且在整个栅电极级布局上最小化。栅电极级布局内的线性布局特征在一个或多个p型和/或n型扩散区域上延伸,以形成PMOS和NMOS晶体管器件。 PMOS晶体管器件的数量等于单元中的NMOS晶体管器件的数量。

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