AUTOMATED SEMICONDUCTOR DESIGN FLAW DETECTION SYSTEM

摘要

The process by which a logical simulation model is implemented in a physical device may introduce errors in the resulting implementation. A simulation system enables comparison of a realized physical implementation against the simulation models that produce them, thereby detecting differences between an initial, logical design and the resulting physical embodiment. Errors introduced by an initial design, faulty Intellectual Property blocks, faulty programmable logic device silicon, faulty synthesis algorithms and software, and faulty place and route algorithms and software may be detected. As a result, the simulation system reflects both the accuracy of the actual implemented device with the capacity and performance of a purpose built hardware-assisted solution.