首页> 外国专利> Method for detecting leading edge blanking parameter of power management chip

Method for detecting leading edge blanking parameter of power management chip

机译:电源管理芯片前沿消隐参数的检测方法

摘要

A method for detecting a leading edge blanking parameter of a power management chip includes generating a pulse signal and inputting the pulse signal to the power management chip, wherein the amplitude of the pulse signal will cause a PWM signal of the power management chip to change its duty cycle; detecting the PWM signal to generate a detecting resu when the detecting result indicates that the duty cycle of the PWM signal does not change, adjusting a pulse width of the pulse signal to generate an adjusted pulse signal, inputting the adjusted pulse signal to the power management chip and detecting the PWM signal; and when the detecting result indicates that the duty cycle of the PWM signal changes, determining the leading edge blanking parameter of the power management chip according to the pulse width of the pulse signal.
机译:一种用于检测电源管理芯片的前沿消隐参数的方法,包括生成脉冲信号并将该脉冲信号输入至电源管理芯片,其中脉冲信号的幅度将导致电源管理芯片的PWM信号改变其功率。占空比;检测PWM信号以产生检测结果;当检测结果表明PWM信号的占空比没有变化时,调整脉冲信号的脉冲宽度以产生调整后的脉冲信号,将调整后的脉冲信号输入电源管理芯片并检测PWM信号;当检测结果表明PWM信号的占空比改变时,根据脉冲信号的脉冲宽度确定电源管理芯片的前沿消隐参数。

著录项

  • 公开/公告号US7646191B2

    专利类型

  • 公开/公告日2010-01-12

    原文格式PDF

  • 申请/专利权人 CHUI-HUA CHIU;

    申请/专利号US20070867004

  • 发明设计人 CHUI-HUA CHIU;

    申请日2007-10-04

  • 分类号G01D1/14;

  • 国家 US

  • 入库时间 2022-08-21 18:50:07

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号