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Error catch RAM support using fan-out/fan-in matrix
Error catch RAM support using fan-out/fan-in matrix
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机译:使用扇出/扇入矩阵支持错误捕获RAM
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摘要
In accordance with one embodiment of the invention, a method and apparatus are provided for obtaining test data from multiples devices under test. This could be accomplished in accordance with one embodiment by outputting from a testing device a test signal for input in parallel to at least two devices under test; inputting in parallel to the testing device at least two response signals, each response signal produced by one of the at least two devices under test; storing the response signals received in parallel in a storage device; and serially outputting the response signals from the storage device.
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