首页> 外国专利> EDA methodology for extending ghost feature beyond notched active to improve adjacent gate CD control using a two-print-two-etch approach

EDA methodology for extending ghost feature beyond notched active to improve adjacent gate CD control using a two-print-two-etch approach

机译:EDA方法可将虚影特征扩展到有缺口的有源区域之外,以使用两次印刷两次蚀刻方法来改善相邻栅极CD控制

摘要

In accordance with various embodiments, semiconductor devices and methods of forming semiconductor devices having non-rectangular active regions are provided. An exemplary method includes using a first mask to form a plurality of first features over a non-rectangular shaped active region and at least one ghost feature, wherein the plurality of first features extend beyond an edge of the non-rectangular shaped active region. The method further includes using a second mask to remove a portion of the plurality of first features extending beyond the edge of the non-rectangular shaped active region and the at least one ghost feature.
机译:根据各种实施例,提供了半导体器件和形成具有非矩形有源区的半导体器件的方法。示例性方法包括使用第一掩模在非矩形有源区域上形成多个第一特征和至少一个重影特征,其中多个第一特征延伸超过非矩形有源区域的边缘。该方法还包括使用第二掩模来去除多个第一特征的一部分,该多个第一特征延伸超出非矩形有源区域和至少一个重影特征的边缘。

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