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On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
On-chip phase microscope/beam profiler based on differential interference contrast and/or surface plasmon assisted interference
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机译:基于微分干涉对比和/或表面等离子体激元辅助干涉的片上相位显微镜/光束轮廓仪
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摘要
A differential interference contrast (DIC) determination device and method utilizes an illumination source, a layer having a pair of two apertures that receive illumination from the illumination source, and a photodetector to receive Young's interference from the illumination passing through the pair of two apertures. In addition, a surface plasmon assisted optofluidic microscope and method utilize an illumination source, a fluid channel having a layer with at least one aperture as a surface, and a photodetector that receives a signal based on the illumination passing through the aperture. The layer is corrugated (e.g., via fabrication) and parameters of the corrugation optimize the signal received on the photodetector.
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