首页>
外国专利>
Method and apparatus for evaluating integrated circuit design model performance using basic block vectors and fly-by vectors including microarchitecture dependent information
Method and apparatus for evaluating integrated circuit design model performance using basic block vectors and fly-by vectors including microarchitecture dependent information
展开▼
机译:使用基本块向量和包含微体系结构相关信息的飞越向量来评估集成电路设计模型性能的方法和装置
展开▼
页面导航
摘要
著录项
相似文献
摘要
A test system or simulator includes an IC test application sampling software program that executes test application software on a semiconductor die IC design model. The test application sampling software includes trace, simulation point, CPI error, clustering and other programs. IC designers utilize the test application sampling software to evaluate the performance characteristics of IC designs with test software applications. The test application sampling software generates basic block vectors (BBVs) and fly-by vectors (FBVs) from instruction trace analysis of test application software. The test application sampling software analyzes microarchitecture dependent information that it uses to generate the FBVs. Test application sampling software generates a reduced representative test application software program from the BBV and FBV data utilizing an instruction budgeting method. Designers use the test system with test application sampling software to evaluate IC design models by using the representative test application software program.
展开▼