首页> 外国专利> Deterministic wavelet thresholding for general-error metrics

Deterministic wavelet thresholding for general-error metrics

机译:一般误差指标的确定性小波阈值

摘要

Novel, computationally efficient schemes for deterministic wavelet thresholding with the objective of optimizing maximum-error metrics are provided. An optimal low polynomial-time algorithm for one-dimensional wavelet thresholding based on a new dynamic-programming (DP) formulation is provided that can be employed to minimize the maximum relative or absolute error in the data reconstruction. Directly extending a one-dimensional DP algorithm to multi-dimensional wavelets results in a super-exponential increase in time complexity with the data dimensionality. Thus, novel, polynomial-time approximation schemes (with tunable approximation guarantees for the target maximum-error metric) for deterministic wavelet thresholding in multiple dimensions are also provided.
机译:提供了用于确定性小波阈值处理的新颖,计算有效的方案,其目的是优化最大误差度量。提供了一种基于新的动态编程(DP)公式的一维小波阈值优化的最佳低多项式时间算法,该算法可用于最小化数据重构中的最大相对误差或绝对误差。将一维DP算法直接扩展到多维小波会导致时间复杂度随数据维数呈指数增长。因此,还提供了用于多维确定性小波阈值化的新颖的多项式时间近似方案(具有目标最大误差度量的可调近似保证)。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号