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Pixel testing circuit and method for liquid crystal display device

机译:液晶显示装置的像素测试电路及方法

摘要

A testing circuit and method for a liquid crystal display device are presented. The circuit comprises: a substrate, a plurality of pixels formed on the substrate and having n sub-pixels, a plurality of signal paths, and a plurality of p shorting bars, The plurality of signal paths is formed on the substrate and connected to the sub-pixels correspondingly; the p shorting bars are formed on the substrate and respectively connected to (p×m+1)th, (p×m+2)th, (p×m+3)th . . . , (p×m+p)th numbered signal paths The method comprises: dividing the p shorting bars into n groups; and applying testing signals respectively to the shorting bars of every group. The method also comprises: dividing the p shorting bars into groups by odd-even sequence; and applying testing signals respectively to every group, so as to effectively increase the testing efficiency of array and cell tests in fabrication of the device.
机译:提出了一种用于液晶显示装置的测试电路和方法。该电路包括:基板;形成在基板上并具有n个子像素的多个像素;多个信号路径;以及多个p个短路棒。所述多个信号路径形成在基板上并连接至基板。子像素对应; p个短路棒形成在基板上并分别连接到第(p×m + 1),(p×m + 2),(p×m + 3)。 。 。 ,第(p×m + p)个编号的信号路径。该方法包括:将p个短路条分成n组;将测试信号分别施加到每组的短路棒上。该方法还包括:通过奇偶序列将p个短路条分成组;将测试信号分别施加到每个组,以有效提高器件制造过程中阵列和单元测试的测试效率。

著录项

  • 公开/公告号US7659744B2

    专利类型

  • 公开/公告日2010-02-09

    原文格式PDF

  • 申请/专利权人 MING-SHENG LAI;

    申请/专利号US20080230720

  • 发明设计人 MING-SHENG LAI;

    申请日2008-09-04

  • 分类号G01R31/00;

  • 国家 US

  • 入库时间 2022-08-21 18:47:45

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