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Meta-data driven test-data generation with controllable combinatorial coverage
Meta-data driven test-data generation with controllable combinatorial coverage
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机译:具有可控制的组合覆盖范围的元数据驱动的测试数据生成
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摘要
Generation of test data for systems having functionality subject to a grammar or other sort of meta-data is automated by a controlled combinatorial approximation of naïve combinatorial coverage. A suite of control mechanisms are applied to an algorithm that generates test data to provide well-defined and understandable approximations of full combinatorial coverage.
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