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A METHOD FOR INCORPORATING FAIL DATA FROM MULTIPLE APPLICATIONS OF TEST PATTERNS AND SYSTEM THEREOF
A METHOD FOR INCORPORATING FAIL DATA FROM MULTIPLE APPLICATIONS OF TEST PATTERNS AND SYSTEM THEREOF
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机译:一种从测试应用的多种应用中合并失败数据的方法及其系统
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摘要
A diagnostic process applicable to VLSI designs to address the accuracy of diagnostic resolution. Environmentally based fail data drives adaptive test methods which hone the test pattern set and fail data collection for successful diagnostic resolution. Environmentally based fail data is used in diagnostic simulation to achieve a more accurate environmentally based fault callout. When needed, additional information is included in the process to further refine and define the simulation or callout result. Similarly, as needed adaptive test pattern generation methods are employed to result in enhanced diagnostic resolution.
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