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NICKEL-CONTAINING FILM-FORMING MATERIAL AND PROCESS FOR PRODUCING NICKEL-CONTAINING FILM

机译:含镍成膜材料及生产含镍膜的方法

摘要

NICKEL-CONTAINING FILM-FORMING MATERIAL AND PROCESS FOR PRODUCINGNICKEL-CONTAINING FILM ABSTRACT It is an object of the present invention to provide anickel-containing film-forming material which has a low melting point, can be handled as a liquid, has a high vapor pressure, can be readily synthesized industrially, is stable and can be readily formed into a favorable film in the formation of a nickel-containing film by aCVD (chemical vapor deposition) method, preferably in the formation of a nickel silicide film. The nickel-containing film-forming material of the invention is characterized by comprising a compound representedbya structureof the following formula (1) . In the formula (1), R[err] and R[err] are each independently a hydrogen atom or a grouprepresented by a structure of the following formula (2), a and b are each an integer of 0 to 4, and a and b satisfy the condition of 0[err]a+b[err]4 with the exception of a case where R[err] and R[err] are both hydrogen atoms. In the formula (2) , R[err], R[err] and R[err] are each independently an alkyl group of 1 to 2 carbon atoms.[err]
机译:含镍成膜材料及其生产方法含镍膜抽象本发明的目的是提供一种熔点低的含镍成膜材料,可作为液体处理,蒸气压高,易于处理工业合成的,稳定的,易于形成形成含镍薄膜的有利薄膜CVD(化学气相沉积)方法,最好在地层中硅化镍膜。含镍成膜本发明的材料的特征在于包含化合物由下式(1)的结构表示。在公式(1),R [err]和R [err]分别独立地为氢原子或基团由下式(2)的结构表示,a和b是每个整数都为0到4,并且a和b满足条件0 [err] a + b [err] 4除了R [err]和R [err]都是氢原子的情况以外。在式(2)中,R [err],R [err]和R [err]分别独立地为烷基。1-2个碳原子[呃]

著录项

  • 公开/公告号SG162872A1

    专利类型

  • 公开/公告日2010-08-30

    原文格式PDF

  • 申请/专利权人 SHOWA DENKO K.K.;

    申请/专利号SG2010044972

  • 发明设计人 HIRO TOSHITAKA;KOBAYASHI TAKAMITSU;

    申请日2008-12-16

  • 分类号C23C16/42;H01L21/28;H01L21/285;

  • 国家 SG

  • 入库时间 2022-08-21 18:44:27

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