首页> 外国专利> METHOD AND DEVICE FOR MEASURING A DENSITY-INDEPENDENT MOISTURE VALUE AND A DENSITY VALUE OF DIELECTRIC MATERIALS FROM THE FREQUENCY SHIFTS OF TWO MICROWAVE RESONATORS OR TWO MODES OF A MICROWAVE RESONATOR

METHOD AND DEVICE FOR MEASURING A DENSITY-INDEPENDENT MOISTURE VALUE AND A DENSITY VALUE OF DIELECTRIC MATERIALS FROM THE FREQUENCY SHIFTS OF TWO MICROWAVE RESONATORS OR TWO MODES OF A MICROWAVE RESONATOR

机译:从两个微波谐振器或两种模式的谐振器的频率偏移量测量介电常数和介电材料密度值的方法和装置

摘要

Method for measuring a moisture value F of dielectric materials using at least one microwave resonator, wherein a shift A in the resonant frequency is respectively evaluated for at least two resonant modes with different resonant frequencies and a moisture value which is independent of density is calculated from the measured shifts in the resonant frequency.
机译:一种使用至少一个微波谐振器测量介电材料水分值F的方法,其中分别针对具有不同谐振频率的至少两个谐振模式分别评估谐振频率的偏移A,并从中计算出与密度无关的水分值测得的谐振频率偏移。

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