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SYSTEM AND METHOD FOR PERFORMING A RUGGEDNESS MEASUREMENT TEST ON A DEVICE UNDER TEST
SYSTEM AND METHOD FOR PERFORMING A RUGGEDNESS MEASUREMENT TEST ON A DEVICE UNDER TEST
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机译:在测试下在设备上执行粗糙度测量的系统和方法
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摘要
A system and method for performing a ruggedness measurement test on a device under test (DUT) uses a first impedance creating device and a second impedance creating device, which are connected to the DUT via a coupler, to produce a combined reflection signal that corresponds to a total reflection coefficient suitable for a ruggedness measurement of the DUT. The first impedance creating device is configured to produce a first reflection signal that corresponds to a first reflection coefficient. The second impedance creating device is configured to produce a second reflection signal that corresponds to a second reflection coefficient. Each of the first and second impedance creating devices is adjustable with respect to impedance to produce the respective reflection signal. The first and second reflection signals are combined by the coupler to produce the combined reflection signal that corresponds to the total reflection coefficient.
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