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SYSTEM AND METHOD FOR PERFORMING A RUGGEDNESS MEASUREMENT TEST ON A DEVICE UNDER TEST

机译:在测试下在设备上执行粗糙度测量的系统和方法

摘要

A system and method for performing a ruggedness measurement test on a device under test (DUT) uses a first impedance creating device and a second impedance creating device, which are connected to the DUT via a coupler, to produce a combined reflection signal that corresponds to a total reflection coefficient suitable for a ruggedness measurement of the DUT. The first impedance creating device is configured to produce a first reflection signal that corresponds to a first reflection coefficient. The second impedance creating device is configured to produce a second reflection signal that corresponds to a second reflection coefficient. Each of the first and second impedance creating devices is adjustable with respect to impedance to produce the respective reflection signal. The first and second reflection signals are combined by the coupler to produce the combined reflection signal that corresponds to the total reflection coefficient.
机译:一种用于在被测设备(DUT)上进行耐用性测量测试的系统和方法,其使用通过耦合器连接到DUT的第一阻抗创建设备和第二阻抗创建设备来产生对应于适用于DUT坚固性测量的全反射系数。第一阻抗产生装置被配置为产生对应于第一反射系数的第一反射信号。第二阻抗产生装置被配置为产生对应于第二反射系数的第二反射信号。第一和第二阻抗产生装置中的每个相对于阻抗是可调节的,以产生相应的反射信号。第一和第二反射信号由耦合器组合以产生对应于全反射系数的组合反射信号。

著录项

  • 公开/公告号WO2009144648A3

    专利类型

  • 公开/公告日2010-01-21

    原文格式PDF

  • 申请/专利权人 NXP B.V.;VOLOKHINE IOURI;

    申请/专利号WO2009IB52162

  • 发明设计人 VOLOKHINE IOURI;

    申请日2009-05-23

  • 分类号G01R27/04;

  • 国家 WO

  • 入库时间 2022-08-21 18:40:56

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