首页> 外国专利> SAMPLE HOLDER APPARATUS FOR AN ELECTRON-PROBE MICRO-ANALYZER CAPABLE OF PREVENTING THE MOVEMENT OF A SAMPLE BY PRESSING THE TOP PERIMETER OF THE SAMPLE WITH THE TOP PLATE

SAMPLE HOLDER APPARATUS FOR AN ELECTRON-PROBE MICRO-ANALYZER CAPABLE OF PREVENTING THE MOVEMENT OF A SAMPLE BY PRESSING THE TOP PERIMETER OF THE SAMPLE WITH THE TOP PLATE

机译:用于电子探针微分析仪的样品夹持器装置,能够通过用顶板按压样品的顶孔来防止样品的移动

摘要

PURPOSE: A sample holder apparatus for an electron-probe micro-analyzer is provided to keep the top surface of a sample horizontal by pressing the top and bottom of the same and to hold any size and thickness of sample.;CONSTITUTION: A sample holder apparatus for an electron-probe micro-analyzer comprises a bottom plate(110), a holder body(120), a setting plate, and a top plate(150). The bottom plate is detachably connected to a stage. A sample is accepted in the space of the holder body. The setting plate is arranged to ascend and descend above the bottom plate by a fastener. The top plate is coupled to the upper side of the holder body by a fastener and raised/lowered to partially press and secure the top perimeter of the sample.;COPYRIGHT KIPO 2010
机译:目的:提供一种用于电子探针微分析仪的样品架设备,通过按压样品的顶部和底部使样品的上表面保持水平,并保持任何尺寸和厚度的样品。用于电子探针微分析器的装置包括底板(110),保持器主体(120),安装板和顶板(150)。底板可拆卸地连接到平台。样品在支架主体的空间中被接受。安置板被布置成通过紧固件在底板上方上升和下降。顶板通过紧固件连接到支架主体的上侧,然后升高/降低以部分压紧并固定样品的顶部周边。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100011686A

    专利类型

  • 公开/公告日2010-02-03

    原文格式PDF

  • 申请/专利权人 HYUNDAI STEEL COMPANY;

    申请/专利号KR20080073002

  • 发明设计人 KIM HAK JIN;CHO YOUNG JUN;AHN BYUNG RYANG;

    申请日2008-07-25

  • 分类号G01N1/36;G01N1/00;

  • 国家 KR

  • 入库时间 2022-08-21 18:33:26

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