首页> 外国专利> METHOD FOR MEASURING THE SIZE OF A NANO-PARTICLE USING THE FREQUENCY DISTRIBUTION CURVE OF PROBE-BEAM DEFLECTION SIGNAL MAGNITUDE, WHICH IS GENERATED FROM LASER-INDUCED BREAKDOWN

METHOD FOR MEASURING THE SIZE OF A NANO-PARTICLE USING THE FREQUENCY DISTRIBUTION CURVE OF PROBE-BEAM DEFLECTION SIGNAL MAGNITUDE, WHICH IS GENERATED FROM LASER-INDUCED BREAKDOWN

机译:利用激光诱导击穿产生的探针束偏转信号幅度的频率分布曲线测量纳米粒子尺寸的方法

摘要

PURPOSE: A method for measuring the size of a nano-particle is provided to obtain a normal distribution curve with a Gaussian function shape which is related to the data of a measured probe-beam deflection signal magnitude.;CONSTITUTION: A sample cell(10) generates a laser-induced plasma by radiating pulsed laser beam(1') to a Z-axis direction. Probe beam(13') is radiated to a Y-axis direction. The signal of the probe beam is measured by a photo diode(19). The focus location of the pulsed laser beam is adjusted for overlapping two signals which is reached to the probe beam. A symmetrical frequency distribution of the probe beam signal magnitude is obtained by a gate integrator(22).;COPYRIGHT KIPO 2010
机译:目的:提供一种测量纳米粒子尺寸的方法,以获得具有高斯函数形状的正态分布曲线,该曲线与所测得的探头光束偏转信号幅值的数据有关;构成:样品池(10 )通过向Z轴方向辐射脉冲激光束(1')产生激光诱导的等离子体。探测光束(13')向Y轴方向辐射。探测光束的信号由光电二极管(19)测量。调节脉冲激光束的聚焦位置,以使到达探测光束的两个信号重叠。通过门积分器获得探测光束信号幅度的对称频率分布(22).; COPYRIGHT KIPO 2010

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