首页> 外国专利> METHOD FOR MANUFACTURING A COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR IMAGE SENSOR, CAPABLE OF PREVENTING THE DEVIATION BETWEEN COLOR FILTERS, AND THE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR IMAGE SENSOR MANUFACTURED BY THE SAME

METHOD FOR MANUFACTURING A COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR IMAGE SENSOR, CAPABLE OF PREVENTING THE DEVIATION BETWEEN COLOR FILTERS, AND THE COMPLEMENTARY METAL-OXIDE SEMICONDUCTOR IMAGE SENSOR MANUFACTURED BY THE SAME

机译:制造能够防止彩色滤光片之间偏差的互补金属氧化物半导体图像传感器的方法以及由该方法制造的互补金属氧化物半导体图像传感器

摘要

PURPOSE: A method for manufacturing a complementary metal-oxide semiconductor image sensor(CIS) and the CIS manufactured by the same are provided to simplify a manufacturing process by forming a micro lens with a polymer material which functions as a color filter.;CONSTITUTION: An insulating layer(110) is formed on a semiconductor substrate(100). A protective layer(120) is formed to protect the insulating layer. A color filter is formed with a polymer material. The color filter is annealed to form a micro lens(140). The micro lens includes a red color micro lens(141), a green color micro lens(142), and a blue color micro lens(143).;COPYRIGHT KIPO 2010
机译:目的:提供一种用于制造互补金属氧化物半导体图像传感器(CIS)的方法和由其制造的CIS,以通过用用作滤色镜的聚合物材料形成微透镜来简化制造过程。在半导体衬底(100)上形成绝缘层(110)。形成保护层(120)以保护绝缘层。滤色器由聚合物材料形成。使滤色器退火以形成微透镜(140)。微透镜包括红色微透镜(141),绿色微透镜(142)和蓝色微透镜(143)。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100070439A

    专利类型

  • 公开/公告日2010-06-28

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20080128981

  • 发明设计人 CHO WOO JIN;

    申请日2008-12-18

  • 分类号H01L27/14;H01L27/146;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:28

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