首页> 外国专利> METHOD OF MEASURING TOPOLOGY OF FUNCTIONAL LIQUID DROPLET IN PIXEL, TOPOLOGY MEASURING APPARATUS OF FUNCTIONAL LIQUID IN PIXEL, LIQUID EJECTION APPARATUS, METHOD OF MANUFACTURING ELECTRO-OPTICAL APPARATUS, ELECTRO-OPTICAL APPARATUS, AND ELECTRONIC APPARATUS

METHOD OF MEASURING TOPOLOGY OF FUNCTIONAL LIQUID DROPLET IN PIXEL, TOPOLOGY MEASURING APPARATUS OF FUNCTIONAL LIQUID IN PIXEL, LIQUID EJECTION APPARATUS, METHOD OF MANUFACTURING ELECTRO-OPTICAL APPARATUS, ELECTRO-OPTICAL APPARATUS, AND ELECTRONIC APPARATUS

机译:像素中的功能性液体液滴的拓扑测量方法,像素中的功能性液体的拓扑测量装置,液体喷射装置,制造电光装置的方法,电光装置和电子装置

摘要

A method of measuring topology of functional liquid in a pixel, in which thickness or volume of the functional liquid in the pixel is measured by a surface topology measuring apparatus comprising: measuring surface topologies in which surface topology of the functional liquid in the pixel and surface topology of the bank are measured by the surface topology measuring apparatus, and measurement parameters regarding the surface topologies are generated; adding a bank height in which a height parameter of a height of the bank is added to the measurement parameter of a surface of the functional liquid in the pixel of the measurement parameter generated; and calculating topology in which the thickness or the volume of the functional liquid in the pixel is calculated based on the added measurement parameter of the surface of the functional liquid in the pixel and the measurement parameter of the surface of the bank.
机译:一种测量像素中的功能液体的拓扑的方法,其中通过表面拓扑测量设备测量像素中的功能液体的厚度或体积,该方法包括:测量表面拓扑,其中像素中的功能液体的表面拓扑和表面通过表面拓扑测量装置测量堤的拓扑,并生成关于表面拓扑的测量参数。在所生成的测量参数的像素中,将堤的高度的高度参数添加到功能液的表面的测定参数上的堤的高度上。计算拓扑,其中基于像素中功能液表面的相加测量参数和堤岸表面的测量参数计算像素中功能液的厚度或体积。

著录项

  • 公开/公告号KR100953468B1

    专利类型

  • 公开/公告日2010-04-16

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080007514

  • 发明设计人 사카이 히로후미;아난 마코토;

    申请日2008-01-24

  • 分类号G01B11/06;G01M11;G02F1/13;H01L21/66;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:21

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