首页> 外国专利> Measurement method for very low frost point using quartz crystal microbalance dew-point sensor

Measurement method for very low frost point using quartz crystal microbalance dew-point sensor

机译:使用石英晶体微天平露点传感器测量极低霜点的方法

摘要

A measurement method for ultra low dew point using a quartz crystal microbalance dew point sensor is provided to determine exact dew point by measuring resonant frequency of a crystal oscillator according to temperature change and correcting temperature and resonant frequency. A quartz crystal microbalance dew point sensor comprises a crystal oscillator(10), a crystal oscillator holder(30), a heat sink(20), and a liquid nitrogen feeding unit(50). The crystal oscillator holder is contacted with the edge of the crystal oscillator. On the single-side of the crystal oscillator holder, a platinum resistance thermistor is attached. The heat sink controls the temperature of the crystal oscillator and the crystal oscillator holder using the liquid nitrogen. The liquid nitrogen feeding unit automatically supplies the liquid nitrogen to the heat sink. The quartz crystal microbalance dew point sensor measures the change of the resonant frequency and the temperature of the platinum resistance thermistor according to the temperature change of the crystal oscillator and determines the dew point.
机译:提供一种使用石英微天平露点传感器的超低露点的测量方法,以通过根据温度变化测量晶体振荡器的谐振频率并校正温度和谐振频率来确定精确的露点。石英微天平露点传感器包括晶体振荡器(10),晶体振荡器支架(30),散热器(20)和液氮供给单元(50)。晶体振荡器支架与晶体振荡器的边缘接触。在晶体振荡器支架的单侧,安装了一个铂电阻热敏电阻。散热器使用液氮控制晶体振荡器和晶体振荡器支架的温度。液氮供给单元自动将液氮供应到散热器。石英微天平露点传感器根据晶体振荡器的温度变化来测量谐振频率和铂电阻热敏电阻的温度变化,并确定露点。

著录项

  • 公开/公告号KR100965308B1

    专利类型

  • 公开/公告日2010-06-22

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080021404

  • 发明设计人 권수용;김용규;

    申请日2008-03-07

  • 分类号G01N25/66;G01N25;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:05

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