首页> 外国专利> A process for the preparation of a spacing element for a conduction element by applying an etch stop layer, which, by means of a strongly directional deposition technique is applied and transistor with a spacer element

A process for the preparation of a spacing element for a conduction element by applying an etch stop layer, which, by means of a strongly directional deposition technique is applied and transistor with a spacer element

机译:一种通过施加蚀刻停止层来制备用于导电元件的间隔元件的方法,该蚀刻停止层借助于强方向沉积技术被施加并且具有间隔元件的晶体管

摘要

A method with:Forming a pipe element having an upper surface and a first side wall and a second side wall by means of a semiconductor layer;a directional depositing an etch stop layer via the pipe element and the semiconductor layer, about the upper surface and the semiconductor layer with a desired thickness, while a region with reduced thickness of the etch stop layer on the first and the second side wall is formed, depositing a spacer layer by means of the etch stop layer; andanisotropic etching of the spacer layer, in order to form a spacer element, whereby the on the upper surface of the pipe element and of the semiconductor layer formed on the other side of the etch stop layer for the control of the anisotropic etching is used.
机译:一种方法,包括:借助于半导体层形成具有上表面以及第一侧壁和第二侧壁的管道元件;经由所述管道元件和所述半导体层在所述上表面和第二表面上定向沉积蚀刻停止层。在形成具有期望厚度的半导体层的同时,在第一侧壁和第二侧壁上形成蚀刻停止层的厚度减小的区域,并通过蚀刻停止层沉积间隔层。为了形成隔离元件,对隔离层进行各向异性蚀刻,从而使用在管元件的上表面和在蚀刻停止层的另一侧上形成的半导体层的上表面上的用于各向异性蚀刻的控制。

著录项

  • 公开/公告号DE10361635B4

    专利类型

  • 公开/公告日2010-05-06

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE2003161635

  • 发明设计人

    申请日2003-12-30

  • 分类号H01L21/336;

  • 国家 DE

  • 入库时间 2022-08-21 18:29:10

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