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A process for the contactless measurement of deformations of a surface of an object

机译:一种非接触式测量物体表面变形的方法

摘要

The invention relates to a method for the contact-free measurement of deformations of a surface of a object in which a series of individual images is captured in each of two time windows (T1, T2), wherein between every two individual image captures the image detector is displaced relative to the object and parallel to its detector surface by an optical offset of the size of a fraction of a pixel up to a few pixels, the individual images of the first time window (T1) are processed in pairs with the individual images of the second time window (T2) to produce a set of individual deformation fields (18) and an average of the individual deformation fields (18) is calculated as an output deformation field (20).
机译:本发明涉及一种用于无接触地测量物体的表面的变形的方法,其中在两个时间窗(T1,T2)的每一个中捕获一系列的单个图像,其中,在每个两个单独的图像之间捕获图像。探测器相对于物体并平行于其探测器表面移动了一个像素的小到几个像素的大小的光学偏移,第一时间窗口(T1)的各个图像与单个图像成对处理产生一组单个变形场(18)的第二时间窗口(T2)的图像,并且计算单个变形场(18)的平均值作为输出变形场(20)。

著录项

  • 公开/公告号DE102007037726B4

    专利类型

  • 公开/公告日2010-07-08

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20071037726

  • 发明设计人

    申请日2007-08-09

  • 分类号G01B11/16;

  • 国家 DE

  • 入库时间 2022-08-21 18:29:02

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