Illumination arrangement for the tirf - microscopy

摘要

The illumination for a total reflection ion - fluorescence measurement has previously been carried out either by means of a prism on the side facing away from the microscope objective, wherein the sample to be examined is a complex manner on the prism has to be prepared. Alternatively, tirf - illumination through the microscope objective, which, because of the necessary large angle of incidence a high numerical aperture and thus requires a complex lens. The present invention is to provide an tirf - illumination with a high axial resolution with little effort enable.In that a tirf - illumination device (1) is designed as a module and an optical waveguide (2) and a collimation lens (3), the collimation lens in front of a light exit opening of the optical waveguide is fixed such that they are divergent from the optical waveguide to a collimated light exiting light beam, the excitation light outside of the detection beam path to be brought up to a sample. As a result, the numerical aperture of the excitation of the numerical aperture of the detection of decoupled, so that a standard microscope objective lens for the detection is sufficient.Microscopy