首页> 外国专利> Tool induced shift compensating method for coordinate-measuring machine, involves utilizing compensation function in measured values of edges of structures of different structure types in orientation of mask

Tool induced shift compensating method for coordinate-measuring machine, involves utilizing compensation function in measured values of edges of structures of different structure types in orientation of mask

机译:用于坐标测量机的工具引起的位移补偿方法,涉及在掩模方向上利用补偿功能来测量不同结构类型的结构的边缘的测量值

摘要

The method involves measuring a position of edges of structures of different structure types in an orientation of a mask (2) to be rotated around 180 degrees relative to another orientation of the mask by a coordinate-measuring machine (1). A number of measured structures of the same type in the rotated orientation are smaller or equal than that in the orientation of the mask. A compensation function is determined from measured values for the position and used in the measured values of the edges of the structures in the orientation of the mask. The determined function is stored in a database.
机译:该方法包括通过坐标测量机(1)在掩模(2)的取向上测量不同结构类型的结构的边缘的位置,以相对于掩模的另一取向旋转约180度。在旋转方向上的多个相同类型的测量结构小于或等于掩模方向上的测量结构。根据该位置的测量值确定补偿函数,并在掩模的方向上将其用于结构的边缘的测量值中。确定的功能存储在数据库中。

著录项

  • 公开/公告号DE102008044515A1

    专利类型

  • 公开/公告日2010-03-11

    原文格式PDF

  • 申请/专利权人 VISTEC SEMICONDUCTOR SYSTEMS GMBH;

    申请/专利号DE20081044515

  • 发明设计人 LASKE FRANK;

    申请日2008-09-10

  • 分类号G01B11/03;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:45

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