首页> 外国专利> Spectroscopic measurement device for measuring optical radiation intensity distributions, has detector system adjusted for receiving diffracted radiation from two diffraction gratings

Spectroscopic measurement device for measuring optical radiation intensity distributions, has detector system adjusted for receiving diffracted radiation from two diffraction gratings

机译:用于测量光辐射强度分布的光谱测量设备,其检测器系统经过调整,可以接收来自两个衍射光栅的衍射辐射

摘要

The spectroscopic measurement device has a diffraction grating (403) in one place, where another diffraction grating (404) is aligned in the place. The former diffraction grating receives one portion of an incident radiation, where the latter diffraction grating receives another portion of the incident radiation at the same time. A detector system (407) is adjusted for receiving the radiation diffracted from the two diffraction gratings.
机译:光谱测量设备在一个位置具有衍射光栅(403),在该位置具有另一衍射光栅(404)。前者衍射光栅接收入射辐射的一部分,而后者衍射光栅同时接收入射辐射的另一部分。调节检测器系统(407)以接收从两个衍射光栅衍射的辐射。

著录项

  • 公开/公告号DE102008054733A1

    专利类型

  • 公开/公告日2010-06-17

    原文格式PDF

  • 申请/专利权人 OXFORD INSTRUMENTS ANALYTICAL OY;

    申请/专利号DE20081054733

  • 发明设计人 KRAPU MIKKO;

    申请日2008-12-16

  • 分类号G01J3/18;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:40

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