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A process for the highly resolved detection of nanoparticles on two-dimensional measuring surfaces
A process for the highly resolved detection of nanoparticles on two-dimensional measuring surfaces
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机译:一种在二维测量面上高度分辨地检测纳米颗粒的方法
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摘要
An upper surface plasmons resonance spectrometer comprising a radiation source, which is of substantially monochromatic radiation is emitted by a sensor surface, an optical arrangement for illumination of the sensor surface with the radiation emitted by the radiation source, in such a way that, in the sensor surface surface plasmons can be produced, a detector with a plurality of picture elements, and a viewing optics to the reproduction of the radiation reflected from the sensor surface on the detector, is characterized in that the resolution capability of the viewing optics and of the detector is greater than the with the radiation source, which can be achieved, diffraction-limited resolution.
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