METHOD AND SYSTEM FOR CONSISTENT NON-LINEAR MICROSCOPY WITH FOCAL VOLUME MODULATION TO PROBE MATERIAL ORGANIZATION NANOSTRUCTURING

摘要

The invention relates to a method for the dimensional characterization of a structured material, in which process: an excitation laser beam is generated which is suitable for coherent nonlinear microscopy; this excitation laser beam being focused in a focal volume within the structured material; signals emitted by the structured material are detected; a plurality of emission diagrams are produced, each corresponding to a particular form of the focal volume; the particular shapes being obtained for different non Gaussian spatial profiles of the wavefront of the excitation laser beam; and from the emission diagrams thus produced, dimensional characteristics of said structured material are deduced therefrom.