首页> 外国专利> DEVICE FOR MEASURING TEMPERATURE DISTRIBUTION HAVING TEMPERATURE DISTRIBUTION CALIBRATING FUNCTION AND METHOD FOR CALIBRATING TEMPERATURE DISTRIBUTION

DEVICE FOR MEASURING TEMPERATURE DISTRIBUTION HAVING TEMPERATURE DISTRIBUTION CALIBRATING FUNCTION AND METHOD FOR CALIBRATING TEMPERATURE DISTRIBUTION

机译:具有温度分布校正功能的温度分布测量装置和温度分布校正方法

摘要

PROBLEM TO BE SOLVED: To correct a transmission loss even if a change in the transmission loss caused by a difference of wavelengths of an optical fiber occurs, and to calibrate temperature distribution.SOLUTION: For instance, a first optical pulse (1,100 nm) is oscillated from an LD drive selection circuit (semiconductor laser drive selection circuit) 3, and a second optical pulse (1,050 nm) of the same wavelength as the first anti-stokes light of a back scatter generated from the first optical pulse is oscillated from a semiconductor laser (LD (3))5 for measuring an anti-stokes light wavelength loss while a third optical pulse (1,150 nm) of the same wavelength as the first stoke light of the back scatter generated from the first optical pulse is oscillated from a semiconductor laser (LD (2))4 for measuring a stokes light wavelength loss. By a signal control processing part, the transmission loss of the first anti-stokes light is corrected by the transmission loss of the second optical pulse, and the transmission loss of the first stokes light is corrected by the transmission loss of the third optical pulse.
机译:解决的问题:即使由于光纤波长不同而引起的传输损耗发生变化也要校正传输损耗并校准温度分布。解决方案:例如,第一个光脉冲(1100 nm)为从LD驱动选择电路(半导体激光器驱动选择电路)3振荡,并且与从第一光脉冲产生的反向散射的第一反焦光的波长相同的第二光脉冲(1,050nm)从半导体激光器(LD(3))5用于测量反焦光的波长损耗,同时从第一光脉冲产生与第一光脉冲产生的反向散射的第一斯托克光相同波长的第三光脉冲(1,150 nm)用于测量斯托克斯光波长损耗的半导体激光器(LD(2))4。通过信号控制处理部分,通过第二光脉冲的透射损失来校正第一防焦烧光的透射损失,并且通过第三光脉冲的透射损失来校正第一斯托克斯光的透射损失。

著录项

  • 公开/公告号JP2011209225A

    专利类型

  • 公开/公告日2011-10-20

    原文格式PDF

  • 申请/专利权人 OCC CORP;

    申请/专利号JP20100079284

  • 发明设计人 NEMOTO KAZUMASA;

    申请日2010-03-30

  • 分类号G01K11/12;G01K15;

  • 国家 JP

  • 入库时间 2022-08-21 18:25:45

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