首页> 外国专利> STANDARD LATTICE, METHOD OF USING STANDARD LATTICE, AND OPTICAL INTERFERENCE TOMOGRAPHIC IMAGE DIAGNOSTIC APPARATUS WITH STANDARD LATTICE

STANDARD LATTICE, METHOD OF USING STANDARD LATTICE, AND OPTICAL INTERFERENCE TOMOGRAPHIC IMAGE DIAGNOSTIC APPARATUS WITH STANDARD LATTICE

机译:标准晶格,使用标准晶格的方法以及具有标准晶格的光学X线断层扫描图像诊断设备

摘要

PROBLEM TO BE SOLVED: To provide a standard lattice etc. suited to precisely diagnosing an optical interference tomographic image.;SOLUTION: The standard lattice 100 is used for diagnosing an optical interference tomographic image, formed of a light-transmitting member, and equipped with two or more grid lines 110 on the member. The two or more grid lines 110 are displayed on the optical interference tomographic image. The standard lattice 100 is fixed on an object, the standard lattice 100 and the object are irradiated with low interference light, the standard lattice 100 and the object are measured based on reflected light of the low interference light reflected by the standard lattice 100 and the object, and an error in a measured dimension of the measured object is specified based on a difference of a measured dimension between the grid lines 110 on the standard lattice 100 and an actual dimension between the grid lines 110.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供适于精确地诊断光学干涉断层图像的标准格子等。解决方案:标准格子100用于诊断光学干涉断层图像,该标准格子100由透光构件形成,并配备有成员上的两条或更多条网格线110。在光学干涉断层图像上显示两条或更多条网格线110。将标准格子100固定在物体上,以低干涉光照射标准格子100和物体,基于由标准格子100和物体反射的低干涉光的反射光来测量标准格子100和物体。对象,并且基于标准点阵100上的网格线110之间的测量尺寸与网格线110之间的实际尺寸的差来指定测量对象的测量尺寸的误差。;版权:(C)2011 ,JPO&INPIT

著录项

  • 公开/公告号JP2011158309A

    专利类型

  • 公开/公告日2011-08-18

    原文格式PDF

  • 申请/专利权人 JAPAN HEALTH SCIENCE FOUNDATION;

    申请/专利号JP20100018928

  • 发明设计人 OZAWA NOBUYOSHI;SUMI YASUNORI;

    申请日2010-01-29

  • 分类号G01N21/17;A61C19/04;G01B11/22;

  • 国家 JP

  • 入库时间 2022-08-21 18:25:28

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号