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FINE PARTICLE ANALYZER AND FINE PARTICLE ANALYZING METHOD

机译:细颗粒物分析仪和细颗粒物分析方法

摘要

PPROBLEM TO BE SOLVED: To provide a fine particle analyzer capable of separating fluorescence emitted from fine particles or a fluorescent substance labeled with the fine particles into a plurality of wavelength regions and individually detecting the separated fluorescence without arranging a plurality of detectors. PSOLUTION: The fine particle analyzer is equipped with a light source 1 for irradiating the fine particles P with light, an acoustic optical modulator 8 for diffracting the fluorescence emitted from the fine particles P by irradiation with light, a slit 9 for permitting only the diffracted light of a diffraction center wavelength region in the diffracted light from the acoustic optical modulator 8 to pass, and a detector 7 for detecting the diffracted light of the diffraction center wavelength region having passed through the slit 9. PCOPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种微粒分析仪,该微粒分析仪能够将来自微粒或由微粒标记的荧光物质发出的荧光分离为多个波长区域,并且无需布置多个检测器就可以单独检测分离出的荧光。

解决方案:微粒分析仪配备有:光源1,用于向微粒P照射光;声光调制器8,用于通过光的照射来散射从微粒P发出的荧光;狭缝9,用于允许仅来自声光调制器8的衍射光中的衍射中心波长区域的衍射光通过,检测器7用于检测通过狭缝9的衍射中心波长区域的衍射光。 (C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP2011163787A

    专利类型

  • 公开/公告日2011-08-25

    原文格式PDF

  • 申请/专利权人 SONY CORP;

    申请/专利号JP20100023720

  • 发明设计人 FUKUMOTO ATSUSHI;TOISHI MITSURU;

    申请日2010-02-05

  • 分类号G01N15/14;

  • 国家 JP

  • 入库时间 2022-08-21 18:24:54

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