首页> 外国专利> OPTICAL DETECTION DEVICE, OPTICAL CHARACTERISTIC MEASUREMENT DEVICE, OPTICAL CHARACTERISTIC MEASUREMENT METHOD, EXPOSURE APPARATUS, EXPOSURE METHOD, AND METHOD OF MANUFACTURING DEVICE

OPTICAL DETECTION DEVICE, OPTICAL CHARACTERISTIC MEASUREMENT DEVICE, OPTICAL CHARACTERISTIC MEASUREMENT METHOD, EXPOSURE APPARATUS, EXPOSURE METHOD, AND METHOD OF MANUFACTURING DEVICE

机译:光学检测设备,光学特性测量设备,光学特性测量方法,曝光设备,曝光方法以及制造设备的方法

摘要

PROBLEM TO BE SOLVED: To provide an optical detection device usable for optical characteristics measurement of an inspection object optical system having a large numerical aperture, to provide an optical characteristics measurement device using the same, to provide an optical characteristics measurement method, to provide an exposure apparatus, to provide an exposure method, and to provide a method of manufacturing a device.;SOLUTION: The optical detection device includes an imaging unit including: a substrate; an aperture pattern arranged on one surface of the substrate; a fluorescent unit having a fluorescent film formed on a surface of the substrate facing the one surface; a light guide member composed by bundling a plurality of optical fibers; and an imaging element arranged in contact with one surface of the light guide member. Here, a surface of the fluorescent unit on the fluorescent film side is arranged oppositely to a surface of the imaging unit on the light guide member side.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种可用于具有大数值孔径的检查对象光学系统的光学特性测量的光学检测设备,提供一种使用该光学检测设备的光学特性测量设备,提供一种光学特性测量方法,提供一种光学检测设备。曝光设备,提供一种曝光方法,并提供一种制造装置的方法。孔图案布置在基板的一个表面上;荧光体,其在与所述一面相对的一面上形成有荧光膜。通过捆扎多根光纤而构成的导光部件。成像元件布置成与导光构件的一个表面接触。在此,荧光膜侧的荧光单元的表面与导光部件侧的成像单元的表面相对地配置。版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2011166013A

    专利类型

  • 公开/公告日2011-08-25

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP20100028891

  • 发明设计人 EZURA YOSHINOBU;ISHIZAWA HITOSHI;

    申请日2010-02-12

  • 分类号H01L21/027;G01J1/02;G01J1/04;G03F7/20;H01L27/14;

  • 国家 JP

  • 入库时间 2022-08-21 18:24:38

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