PRIMARY AND SECONDARY LIGHT SUSCEPTIBILITY ANISOTROPIC SIMULTANEOUS MEASURING METHOD IN LIGHT SECONDARY NONLINEAR THIN FILM, DEVICE FOR EXECUTING THE METHOD, AND PROGRAM FOR ALLOWING COMPUTER TO EXECUTE THE METHOD

摘要

PROBLEM TO BE SOLVED: To provide a method for determining experimentally and simultaneously both a birefractive index and a nonlinear optical constant of a thin film having light secondary non-linearity.;SOLUTION: An SH-MF ratio curve as an experimental measuring curve is calculated as a ratio between measurement data corresponding to each incident angle constituting two kinds of SH-MF curves acquired from one light secondary nonlinear thin film. Then, approximation operation processing between the SH-MF ratio curve as the experimental measuring curve and a theoretical function expression corresponding thereto is executed, and two unknown parameter values of the theoretical function expression are determined. Thereafter, a value determined with respect to the two unknown parameters is outputted.;COPYRIGHT: (C)2011,JPO&INPIT