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Temperature measuring device, temperature measuring method, temperature measuring system, control system, control method

机译:温度测量装置,温度测量方法,温度测量系统,控制系统,控制方法

摘要

PPROBLEM TO BE SOLVED: To suppress to the utmost a labor, a time and cost required for temperature measurement, by measuring at a plurality of measuring points at a time with a simple constitution. PSOLUTION: This device comprises a light source 110; the first splitter 120 for splitting light from the light source into light for temperature measurement and a reference light; the second splitter 130 for splitting the light for measurement into the first to the n-th measuring light to the number of n; a reference light reflection means 140 for reflecting the reference light; a driving means 142 for changing the optical path length of the reflected reference light by driving the reference light reflection means; and a light receiving means 150 for measuring interference between the first to the n-th measuring light reflected from a temperature measuring object T and the reference light reflected from the reference light reflection means. Each optical path length of the first to the n-th measuring light from the second splitter to the object T is mutually different respectively. PCOPYRIGHT: (C)2006,JPO&NCIPI
机译:

要解决的问题:通过用简单的结构一次在多个测量点进行测量,最大程度地减少了温度测量所需的劳力,时间和成本。

解决方案:该设备包括光源110;光源110和光源110。第一分离器120用于将来自光源的光分离为用于温度测量的光和参考光。第二分离器130用于将测量光分成数量为n的第一至第n测量光。参考光反射装置140,用于反射参考光。驱动装置142,用于通过驱动基准光反射装置来改变反射的基准光的光路长度。光接收装置150,其用于测量从温度测量对象T反射的第一至第n测量光与从参考光反射装置反射的参考光之间的干涉。从第二分离器到物体T的第一至第n测量光的每个光路长度分别彼此不同。

版权:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4756845B2

    专利类型

  • 公开/公告日2011-08-24

    原文格式PDF

  • 申请/专利权人 東京エレクトロン株式会社;

    申请/专利号JP20040297877

  • 发明设计人 鈴木 智博;輿水 地塩;

    申请日2004-10-12

  • 分类号G01K11/12;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-21 18:20:25

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