首页> 外国专利> METHOD OF MEASURING OPTIMAL SEEK TIME BY CONSIDERING MAGNETIC HEAD SETTLING TIME, AND INSPECTION DEVICE USING THIS MEASURING METHOD

METHOD OF MEASURING OPTIMAL SEEK TIME BY CONSIDERING MAGNETIC HEAD SETTLING TIME, AND INSPECTION DEVICE USING THIS MEASURING METHOD

机译:考虑磁头停留时间的最佳搜索时间的测量方法,以及使用该测量方法的检查装置

摘要

PROBLEM TO BE SOLVED: To provide an optimal seek time-measuring method which can measure and set up the optimal seek and improve the inspection throughput when inspecting a magnetic disk or a magnetic head, and to provide an inspection device using this measuring method.;SOLUTION: This invention obtains differences between the positive-side average and the negative-side average of read signals for each sector throughout one track, writes the test data by calculating the seek time by changing the settling time using the maximum H and the minimum L of the differences, reads the test data and calculates the average variation DEV=(H-L)/(H+L), and obtains the minimum settling time out of the settling time whose average change DEV becomes equal to or smaller than a predetermined value, as the optimal settling time or the optimal seek time.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种最优的寻道时间测量方法,该方法可以测量和设置最优寻道并提高检查磁盘或磁头时的检查吞吐量,并提供一种使用该测量方法的检查装置。解决方案:本发明获得一条磁道中每个扇区的读取信号的正侧平均值和负侧平均值之差,通过使用最大H和最小L改变建立时间来计算寻道时间,从而写入测试数据求出差值,读取测试数据并计算出平均变化DEV =(HL)/(H + L),从平均变化DEV成为规定值以下的稳定时间中求出最小稳定时间,作为最佳稳定时间或最佳寻道时间。;版权所有:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2010277638A

    专利类型

  • 公开/公告日2010-12-09

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECHNOLOGIES CORP;

    申请/专利号JP20090128633

  • 发明设计人 SHIDARA KENICHI;MAEDA SUMIHIRO;

    申请日2009-05-28

  • 分类号G11B20/18;G11B21/10;

  • 国家 JP

  • 入库时间 2022-08-21 18:20:26

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