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Rinse treatment manner and development treatment manner, the development central processing unit, forming the developer paddle on the resist

机译:冲洗处理方式和显影处理方式,显影中央处理单元,在抗蚀剂上形成显影剂桨

摘要

PROBLEM TO BE SOLVED: To provide a rinsing method capable of reducing development faults due to development residues irrespective of a surface state of a resist.;SOLUTION: The rinsing method for rinsing a substrate after an exposure pattern is developed comprises a process (step 5) wherein the substrate, on which a development solution paddle is existent after the development was finished, is made to be a stopped state or a rotated state, and a rinse solution is supplied to the center of the substrate; a process (step 6) wherein the supply of the rinse solution is stopped, in the state where the development solution paddle remains at least at an outside portion on the substrate; and a process (step 7) wherein the development solution on the substrate is shaken off together with the rinse solution by rotating the substrate at a high speed.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种冲洗方法,其能够减少由于显影残留而导致的显影缺陷,而与抗蚀剂的表面状态无关。解决方案:用于在曝光图案显影后冲洗基板的冲洗方法包括一个过程(步骤5) ),其中,在显影结束后将存在显影液刮板的基板设为停止状态或旋转状态,并向基板的中央供给清洗液。一种处理(步骤6),其中在显影液叶片至少保留在基板的外部的状态下,停止漂洗液的供应; ;以及一种方法(步骤7),其中通过高速旋转基板,将基板上的显影液与冲洗液一起振摇。;版权所有:(C)2007,JPO&INPIT

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