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Electric quality decisive method of test sample

机译:测试样品的电气质量决定性方法

摘要

The method of acquiring the electric quality of the test sample which has with the non-conductive area and the test area of conductivity or semi- conductivity by doing multiple measurement the multi point probes (multi-point) of making use. The step which selects one tip/chip which becomes the electric current source which is used in order the said method, carrying step and the probe which supply the magnetic field which possesses the line of magnetic force which passes the test area vertically to the 1st position of the test area, is positioned between step and decide the distance between the tips/chips step and the tip/chip which decide the position of each tip/chip for the boundary which is between step and the non-conductive area and the test area which make the electric conduction tip/chip of the probe contact with the test area to decide the voltage with the test sample and, step and the probe which measure 1It includes with the step which calculates the electric quality of the test area the step which is made to move and, the step which measures 2 and, 1st measurement and on the basis of 2nd measurement.
机译:通过多次测量使用的多点探针(多点)来获得具有非导电区域和导电性或半导电性的测试区域的被测样品的电气质量的方法。选择用于按照上述方法顺序使用的电流源的一个尖端/芯片的步骤,输送步骤和提供具有垂直通过测试区域的磁力线的磁场的探头到达第一位置测试区域的位置位于台阶之间,并确定尖端/芯片台阶与尖端/芯片之间的距离,从而确定每个尖端/芯片在台阶与非导电区域和测试区域之间的边界的位置使探头的导电尖端/芯片与测试区域接触以确定与测试样品的电压,以及测量的步骤和探头1包括与计算测试区域的电能质量的步骤进行移动,在第二测量的基础上进行第二测量和第一测量的步骤。

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