Food quality inspection equipment, food ingredients inspection equipment, foreign matter component inspection equipment, eating quality inspection apparatus and transition state inspection equipment

摘要

PPROBLEM TO BE SOLVED: To provide a food quality inspecting device capable of inspecting food quality at high sensitivity using an InP-based photodiode in which a dark current is reduced, without the use of a cooling mechanism and where a light reception sensitivity is enhanced to a wavelength 1.8 m. PSOLUTION: A light-receiving layer 3 has a multiple quantum well structure of a III-V semiconductor; a p-n junction 15 is formed by selectively dispersing an impurity element in the light-receiving layer; impurity concentration in the light-receiving layer is 510SP16/SP/cmSP3/SP; a dispersion concentration distribution adjusting layer has an n-type impurity concentration of 210SP15/SP/cmSP3/SPbefore dispersion, and has a low impurity concentration range in a thickness range of the light-receiving layer side; and the inspection device receives a light of at least a single wavelength included in water absorbing zone of a wavelength 3 m and executes inspection. PCOPYRIGHT: (C)2011,JPO&INPIT