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The hole formation process which forms the hole of the depth which does not penetrate completely the aforementioned insulating

机译:形成深度不能完全穿透上述绝缘的孔的成孔工艺

摘要

PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor film for improving the characteristics of elements such as a thin film transistor at the time of forming a semiconductor film by carrying out melting and crystallization using micropores.;SOLUTION: This method for manufacturing a semiconductor film comprises a micropore formation process for forming a micropore (14) in an insulating film (12) formed on a substrate (10); a first film formation process for forming a non-single crystal semiconductor film (16) in the micropore and on the insulating film; a melting and crystallizing process for melting and crystallizing the non-single crystal semiconductor film, and for forming a first crystal semiconductor film (18) with the micropore as almost a center; and a second film formation process for forming a second crystal semiconductor film (20) by epitaxially growing the semiconductor on the first crystal semiconductor film.;COPYRIGHT: (C)2005,JPO&NCIPI
机译:解决的问题:提供一种用于制造半导体膜的方法,该方法用于通过使用微孔进行熔融和结晶来形成半导体膜时改善诸如薄膜晶体管之类的元件的特性。半导体膜包括微孔形成工艺,用于在形成在基板(10)上的绝缘膜(12)中形成微孔(14);第一膜形成工艺,用于在微孔中和绝缘膜上形成非单晶半导体膜(16);熔融结晶处理,用于使非单晶半导体膜熔融结晶化,以微孔为中心形成第一结晶半导体膜(18)。以及通过在第一晶体半导体膜上外延生长半导体来形成第二晶体半导体膜(20)的第二膜形成工艺。版权所有:(C)2005,JPO&NCIPI

著录项

  • 公开/公告号JP4711042B2

    专利类型

  • 公开/公告日2011-06-29

    原文格式PDF

  • 申请/专利权人 セイコーエプソン株式会社;

    申请/专利号JP20040076808

  • 发明设计人 島田 浩行;

    申请日2004-03-17

  • 分类号H01L21/20;C30B29/06;C30B29/52;H01L21/205;H01L21/336;H01L29/786;H01L51/50;

  • 国家 JP

  • 入库时间 2022-08-21 18:18:26

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