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Trace failure observation system, trace failure observation program trace and failure monitoring method

机译:跟踪故障观察系统,跟踪故障观察程序跟踪和故障监视方法

摘要

It can be collected exhaustively the information needed to check the operation of the system in the desired amount of information to be observed in many cases, analysis of the desired operation to provide an easy trace failure observation system. The system LSI internal trace failure observed object, and event detection means for observing the behavior of the observed object part of the observation data so that the amount of information the observation data from the event detection means can be processed by the data reduction means the second I have a data reduction means for performing a second data reduction and first means for performing reduction processing, the reduction processing of the observation data comprising one or more steps.
机译:在许多情况下,可以详尽地收集要观察的所需信息量中检查系统操作所需的信息,对所需操作进行分析以提供易于跟踪失败的观察系统。系统LSI内部跟踪故障观察对象,以及事件检测装置,其用于观察观察数据的观察对象部分的行为,使得来自事件检测装置的观察数据的信息量可以由数据缩减装置处理。我具有用于执行第二数据缩减的数据缩减装置和用于执行缩减处理的第一装置,观测数据的缩减处理包括一个或多个步骤。

著录项

  • 公开/公告号JPWO2009099045A1

    专利类型

  • 公开/公告日2011-05-26

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP20090552467

  • 发明设计人 鈴木 紀章;酒井 淳嗣;

    申请日2009-02-03

  • 分类号G06F11/28;

  • 国家 JP

  • 入库时间 2022-08-21 18:16:55

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