In order to make tip/chip efficiency maximum, the device and methodological null duty cycle revision in order oneself to calibrate the duty cycle

摘要

An apparatus and method for automatically calibrating a duty cycle circuit so as to maximize the performance SOLVED]. Built-in circuit of the chip level to automatically calibrate the set value of (DCC) circuit duty cycle correction is provided for chip [MEANS FOR SOLVING PROBLEMS] each. And clock generation macro unit, and (DCC) circuit, and built-in self test unit and array slice, built-in circuit of the chip level, and a DCC circuit controller simple duty cycle correction. A result of built-in self-test of the array, ie pass or fail is given to the DCC circuit controller. If the result of built-in self test is passed, DCC control bit setting of the DCC circuit the current controller is set as the set value of the chip. In the case of failure, the DCC control bit setting of the DCC circuit the current controller, it is incremented to the setting value of the next, again, self-test is executed result of built-in self test. [Selection] Figure Figure 1