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The copper alloy bar for the electronic equipment which is superior in heat dissipation Characteristic and resin adhesion

机译:电子设备用铜合金棒,具有优异的散热特性和树脂附着力

摘要

PROBLEM TO BE SOLVED: To provide a Cu-Fe-P-based copper alloy thin plate having good resin adhesion and suited to be used as a heat dissipation board in chip-on-board of an LED chip or the like capable of efficiently dissipating heat.SOLUTION: A copper alloy strip material contains 1.5 to 2.4 mass% of Fe, 0.008 to 0.08 mass% of P, 0.01 to 0.5 mass% of Zn and a remainder composed of Cu and inevitable impurities. In the copper alloy strip material: orientation density of a cube orientation measured by an EBSD method in a crystal structure of a depth range up to 10 μm from the surface of the copper alloy strip material is 10 to 20%; an average crystal grain size measured by the EBSD method is 12 to 20 μm; a maximum height Rz of a surface of a portion obtained by roughening the surface of the copper alloy strip material by a surface treatment agent is 1.0 to 2.0 μm; arithmetic mean roughness Ra of a surface of a portion which is not roughened is 0.02 to 0.05 μm; a maximum height Rz of the surface of the portion which is not roughened is 0.20 to 0.40 μm; and a ratio Rq/Rz of root mean square roughness Rq to the maximum height Rz is 0.10 to 0.25.
机译:解决的问题:提供一种Cu-Fe-P基铜合金薄板,其具有良好的树脂粘附性,并且适合用作能够有效消散LED芯片等的板载芯片中的散热板。溶液:铜合金带材包含1.5到2.4质量%的Fe,0.008到0.08质量%的P,0.01到0.5质量%的Zn,以及其余部分由Cu和不可避免的杂质组成。在铜合金带材中,在从铜合金带材的表面起至10μm的深度范围内的晶体结构中,通过EBSD法测定的立方取向的取向密度为10〜20%。通过EBSD法测定的平均结晶粒径为12〜20μm。通过表面处理剂使铜合金带材的表面粗糙化而得到的部分的表面的最大高度Rz为1.0〜2.0μm。未粗糙化的部分的表面的算术平均粗糙度Ra为0.02〜0.05μm。未被粗糙化的部分的表面的最大高度Rz为0.20〜0.40μm。均方根粗糙度Rq与最大高度Rz的比Rq / Rz为0.10〜0.25。

著录项

  • 公开/公告号JP4608025B1

    专利类型

  • 公开/公告日2011-01-05

    原文格式PDF

  • 申请/专利权人 三菱伸銅株式会社;

    申请/专利号JP20100127940

  • 发明设计人 船木 真一;櫻井 健;

    申请日2010-06-03

  • 分类号C22C9/00;C22F1/08;C22F1/00;

  • 国家 JP

  • 入库时间 2022-08-21 18:16:44

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