首页> 外国专利> METHOD AND APPARATUS FOR QUANTITATIVE EVALUATION OF WALL ZETA-POTENTIAL, AND METHOD AND APPARATUS FOR QUANTITATIVE VISUALIZATION OF SURFACE MODIFICATION PATTERN

METHOD AND APPARATUS FOR QUANTITATIVE EVALUATION OF WALL ZETA-POTENTIAL, AND METHOD AND APPARATUS FOR QUANTITATIVE VISUALIZATION OF SURFACE MODIFICATION PATTERN

机译:墙面Zeta势的定量评估方法和装置以及表面修饰图案的定量可视化方法和装置

摘要

A first and a second fluorescent dye are mixed into a solution, the first dye being positively ionized in the solution and the second dye being negatively ionized in the solution and having different fluorescence wavelength from the first dye. The solution is flown onto a measured surface, and the surface is excited with an evanescent wave to produce a fluorescence intensity distribution of two colors. A fluorescence intensity of the surface is measured using a two-dimensional imaging element, the element providing a fluorescence intensity of each color separated from the other colors, thereby calculating a ratio of the fluorescence intensities of the colors. Using an equation expressing a relationship between the ratio of fluorescence intensities and wall zeta potential, the ratio is converted to a two-dimensional distribution of wall zeta potentials. This achieves visualizing in real time and quantitatively evaluating the two-dimensional distribution of wall zeta potentials, and surface modifications.
机译:将第一和第二荧光染料混合到溶液中,第一染料在溶液中被正离子化,第二染料在溶液中被负离子化,并且具有与第一染料不同的荧光波长。将溶液流到被测表面上,并用van逝波激发该表面以产生两种颜色的荧光强度分布。使用二维成像元件测量表面的荧光强度,该元件提供与其他颜色分开的每种颜色的荧光强度,从而计算这些颜色的荧光强度的比率。使用表示荧光强度的比率与壁ζ电势之间的关系的方程式,将该比率转换为壁ζ电势的二维分布。这样可以实现实时可视化并定量评估壁zeta电位和表面修饰的二维分布。

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