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SHAPE MEASUREMENT USING MICROCHIP BASED FRINGE PROJECTION
SHAPE MEASUREMENT USING MICROCHIP BASED FRINGE PROJECTION
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机译:使用基于微芯片的边缘投影进行形状测量
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摘要
A system for measuring a shape of a target object includes a photonic integrated circuit and a light detector. The photonic integrated circuit includes a phase shifter configured to change a phase difference between a first portion of light and a second portion of light within the phase shifter, and an output element configured to output the light from the phase shifter directly toward the target object. The output element includes a first output waveguide configured to act as a first point source; and a second output waveguide configured to act as a second point source. The light detector is positioned to receive reflected light from the target object.
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