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DEVICE FOR THE MEASUREMENT OF COATING THICKNESSES BY MEANS OF MICROWAVES
DEVICE FOR THE MEASUREMENT OF COATING THICKNESSES BY MEANS OF MICROWAVES
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机译:用微波手段测量涂层厚度的装置
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摘要
A device for measurement of a thickness of a coating applied to a substrate includes a transmitter/receiver module configured to transmit and receive microwave radiation; a computing unit; and a probe having a flange and an inner and an outer conductor, wherein the outer conductor coaxially surrounds the inner conductor, and wherein the inner conductor includes at least one thickened section.
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