首页> 外国专利> METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING HOTSPOT DETECTION, REPAIR, AND OPTIMIZATION OF AN ELECTRONIC CIRCUIT DESIGN

METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING HOTSPOT DETECTION, REPAIR, AND OPTIMIZATION OF AN ELECTRONIC CIRCUIT DESIGN

机译:用于实现电子电路设计的热检测,修复和优化的方法,系统和计算机程序产品

摘要

Disclosed are a method, a system, and a computer program product for implementing hotspot detection, repair, and optimization of an electronic circuit design, which, in some embodiments, defines, identifies criteria for hotspots/metrics or optimization objective function; performs the initial hotspot or metric prediction; identifies correction candidate(s); applies a correction candidate to the electronic circuit design; and determines whether the outcome of applying the correction candidate is acceptable. The method or the system identifies custom correction candidate(s) or custom command(s) and identifies one or more hints for the predicted hotspots or metrics; provides a single architecture to use a first model for hotspot identification/correction and a second model for design check; and provides the capability to apply a correction for a hotspot or metric, evaluate the effectiveness of the correction on the fly, and revert any changes made to the electronic circuit design by the correction.
机译:公开了一种用于实现电子电路设计的热点检测,修复和优化的方法,系统和计算机程序产品,其在一些实施例中定义,标识了用于热点/度量或优化目标功能的标准;执行初始热点或指标预测;确定纠正候选者;在电子电路设计中应用校正候选;并确定应用校正候选的结果是否可接受。该方法或系统标识定制校正候选者或定制命令,并标识预测的热点或度量的一个或多个提示;提供一种单一架构,以将第一个模型用于热点识别/校正和第二个模型用于设计检查;并提供对热点或度量进行校正,即时评估校正效果以及还原通过校正对电子电路设计所做的任何更改的功能。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号