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Robust determination of the anisotropic polarizability of nanoparticles using coherent confocal microscopy
Robust determination of the anisotropic polarizability of nanoparticles using coherent confocal microscopy
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机译:相干共聚焦显微镜可靠地测定纳米粒子的各向异性极化率
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摘要
A coherent confocal microscope for fully characterizing the elastic scattering properties of a nanoparticle as a function of wavelength. Using a high numerical aperture lens, two-dimensional scanning and a simple vector beam shaper, the rank-2 polarizability tensor is estimated from a single confocal image. A computationally efficient data processing method is described and numerical simulations show that this algorithm is robust to noise and uncertainty in the focal plane position. The measurement of the polarizability removes the need for a priori assumptions regarding the nanoparticle shape.
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