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Calibrated S-parameter measurements of a high impedance probe
Calibrated S-parameter measurements of a high impedance probe
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机译:高阻抗探头的校准S参数测量
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摘要
A new methodology for the measurement of the S-parameters of a high impedance probe allows obtaining a full two port S-parameter set for the high impedance probe. The measured probe S-parameters are then used for characterization of probes. An alternative method characterizes half of the fixture and termination as a one-port network and expanding it into a two-port error box. The two-port error box is then cascaded with the probe input.
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