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Method for laser desorption/ionization mass spectrometry, sample supporting substrate used therein, and substrate material testing method

机译:激光解吸/电离质谱法,其中使用的样品支撑基板以及基板材料测试方法

摘要

There is disclosed a method of performing laser desorption/ionization mass spectrometry based on ions generated by exposing a sample supported on a substrate to laser light, the sample being to be subjected to spectrum analysis. The method includes the steps of (a) causing a part of the ions to be generated through one of an interaction between the laser light and a surface of the substrate and an interaction between the laser light and an interface between the substrate and the sample; and (b) determining the generated part of the ions to be index ions and identifying a signal to become noise in the laser desorption/ionization mass spectrometry using a signal of the index ions, thereby performing the spectrum analysis without an effect of the noise.
机译:公开了一种基于通过将支撑在基板上的样品暴露于激光而产生的离子进行激光解吸/电离质谱的方法,该样品要进行光谱分析。该方法包括以下步骤:(a)通过激光与衬底表面之间的相互作用以及激光与衬底与样品之间的界面之间的相互作用之一来产生一部分离子; (b)在上述离子解吸/电离质谱法中,将所生成的离子的一部分确定为指示离子,并识别为成为噪声的信号,从而进行频谱分析而不受该噪声的影响。

著录项

  • 公开/公告号US7893400B2

    专利类型

  • 公开/公告日2011-02-22

    原文格式PDF

  • 申请/专利权人 HISASHI TOGASHI;

    申请/专利号US20080112074

  • 发明设计人 HISASHI TOGASHI;

    申请日2008-04-30

  • 分类号H01J49/10;H01J49/26;

  • 国家 US

  • 入库时间 2022-08-21 18:08:53

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