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TANDEM TOF MASS SPECTROMETER WITH HIGH RESOLUTION PRECURSOR SELECTION AND MULTIPLEXED MS-MS
TANDEM TOF MASS SPECTROMETER WITH HIGH RESOLUTION PRECURSOR SELECTION AND MULTIPLEXED MS-MS
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机译:具有高分辨率前体选择和多重MS-MS的串联TOF质谱仪
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摘要
A tandem TOF mass spectrometer includes a first TOF mass analyzer that generates an ion beam comprising a plurality of ions and that selects a group of precursor ions from the plurality of ions. A pulsed ion accelerator accelerates and refocuses the selected group of precursor ions. An ion fragmentation chamber is positioned to receive the selected group of precursor ions that is refocused by the pulsed ion accelerator. At least some of the selected group of precursor ions is fragmented in the ion fragmentation chamber. A second TOF mass analyzer receives the selected group of precursor ions and ion fragments thereof from the ion fragmentation chamber and separates the ion fragments and then detects a fragment ion mass spectrum.
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